Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source Conference Proceeding
Overview
publication date
- August 1, 2019
has restriction
- bronze
Date in CU Experts
- February 18, 2020 4:16 AM
Full Author List
- Esashi Y; Porter CL; Tanksalvala M; Miley GP; Horiguchi N; Knobloch JL; Zhou J; Karl RM; Johnsen P; Bevis CS
author count
- 15
published in
- Microscopy and Microanalysis Journal
Other Profiles
International Standard Serial Number (ISSN)
- 1431-9276
Electronic International Standard Serial Number (EISSN)
- 1435-8115
Digital Object Identifier (DOI)
Additional Document Info
start page
- 116
end page
- 117
volume
- 25
issue
- S2