Partial order reduction for timed circuit verification based on level oriented model
Conference Proceeding
Overview
publication date
- December 16, 2002
Date in CU Experts
- October 28, 2020 2:58 AM
Full Author List
- Kitai T; Oguro Y; Yoneda T; Mercer E; Myers C
author count
- 5
published in
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 1745-1361
Additional Document Info
start page
- 2601
end page
- 2611
volume
- E86D
issue
- 12