Microstructural comparisons of ultrathin Cu films deposited by ion-beam and dc-magnetron sputtering Journal Article uri icon

Overview

publication date

  • May 1, 2005

has restriction

  • green

Date in CU Experts

  • November 5, 2020 2:38 AM

Full Author List

  • Prater WL; Allen EL; Lee WY; Toney MF; Kellock A; Daniels JS; Hedstrom JA; Harrell T

author count

  • 8

citation count

  • 16

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 97

issue

  • 9

number

  • ARTN 093301