Thickness measurements of thin perfluoropolyether polymer films on silicon and amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry Journal Article uri icon

Overview

publication date

  • May 1, 2000

Full Author List

  • Toney MF; Mate CM; Leach KA; Pocker D

Other Profiles

Additional Document Info

start page

  • 219

end page

  • 226

volume

  • 225

issue

  • 1