Micro-structural effects on the performance of poly(thiophene) field-effect transistors Conference Proceeding uri icon

Overview

publication date

  • August 13, 2006

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Salleo A; Jimison LH; Donovan MM; Chabinyc ML; Toney MF

Full Editor List

  • Bao Z; Gundlach DJ

author count

  • 5

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

International Standard Book Number (ISBN) 10

  • 0-8194-6415-5

Additional Document Info

volume

  • 6336