Evolution of nanoscale roughness in Cu/SiO2 and Cu/Ta interfaces
Journal Article
Overview
publication date
- January 9, 2012
Full Author List
- Warren AP; Sun T; Yao B; Barmak K; Toney MF; Coffey KR
published in
- Applied Physics Letters Journal
Other Profiles
Digital Object Identifier (DOI)
Additional Document Info
volume
- 100
issue
- 2