Evolution of nanoscale roughness in Cu/SiO2 and Cu/Ta interfaces Journal Article uri icon

Overview

publication date

  • January 9, 2012

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Warren AP; Sun T; Yao B; Barmak K; Toney MF; Coffey KR

author count

  • 6

citation count

  • 9

Other Profiles

International Standard Serial Number (ISSN)

  • 0003-6951

Electronic International Standard Serial Number (EISSN)

  • 1077-3118

Additional Document Info

volume

  • 100

issue

  • 2

number

  • ARTN 024106