Applications of synchrotron X-rays in microelectronics industry research Conference Proceeding uri icon

Overview

publication date

  • October 10, 2004

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Jordan-Sweet JL; Detavernier C; Lavoie C; Mooney PM; Toney MF

author count

  • 5

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0168-583X

Electronic International Standard Serial Number (EISSN)

  • 1872-9584

Additional Document Info

start page

  • 247

end page

  • 252

volume

  • 241

issue

  • 1-4