Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors Journal Article uri icon

Overview

publication date

  • April 7, 2020

Full Author List

  • Schnepf RR; Levy-Wendt BL; Tellekamp MB; Ortiz BR; Melamed CL; Schelhas LT; Stone KH; Toney MF; Toberer ES; Tamboli AC

Other Profiles

Additional Document Info

start page

  • 4350

end page

  • 4356

volume

  • 8

issue

  • 13