Vertical Confinement and Interface Effects on the Microstructure and Charge Transport of P3HT Thin Films Journal Article uri icon

Overview

publication date

  • April 1, 2013

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:40 AM

Full Author List

  • Jimison LH; Himmelberger S; Duong DT; Rivnay J; Toney MF; Salleo A

author count

  • 6

citation count

  • 81

Other Profiles

International Standard Serial Number (ISSN)

  • 0887-6266

Electronic International Standard Serial Number (EISSN)

  • 1099-0488

Additional Document Info

start page

  • 611

end page

  • 620

volume

  • 51

issue

  • 7