Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
Journal Article
Overview
publication date
- June 1, 2010
Full Author List
- Baker JL; Jimison LH; Mannsfeld S; Volkman S; Yin S; Subramanian V; Salleo A; Alivisatos AP; Toney MF
published in
Other Profiles
Digital Object Identifier (DOI)
Additional Document Info
start page
- 9146
end page
- 9151
volume
- 26
issue
- 11