Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector Journal Article uri icon

Overview

publication date

  • June 1, 2010

Full Author List

  • Baker JL; Jimison LH; Mannsfeld S; Volkman S; Yin S; Subramanian V; Salleo A; Alivisatos AP; Toney MF

Other Profiles

Additional Document Info

start page

  • 9146

end page

  • 9151

volume

  • 26

issue

  • 11