Independent measurements of force and position in atomic force microscopy
Conference Proceeding
Overview
publication date
- August 20, 2009
has restriction
- closed
Date in CU Experts
- November 17, 2020 9:34 AM
Full Author List
- Churnside AB; King GM; Perkins TT
Full Editor List
- Postek MT; Allgair JA
author count
- 3
published in
- Proceedings of SPIE Journal
presented at event
- SPIE NanoScience + Engineering Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X