Defect physics of the CuInSe2 chalcopyrite semiconductor Journal Article uri icon

Overview

publication date

  • April 15, 1998

Date in CU Experts

  • May 5, 2021 2:39 AM

Full Author List

  • Zhang SB; Wei SH; Zunger A; Katayama-Yoshida H

author count

  • 4

citation count

  • 1141

Other Profiles

International Standard Serial Number (ISSN)

  • 1098-0121

Electronic International Standard Serial Number (EISSN)

  • 1550-235X

Additional Document Info

start page

  • 9642

end page

  • 9656

volume

  • 57

issue

  • 16