Realistic Electron Diffusion Rates and Lifetimes Due to Scattering by Electron Holes Journal Article uri icon

Overview

publication date

  • September 1, 2021

has restriction

  • closed

Date in CU Experts

  • September 13, 2021 1:00 AM

Full Author List

  • Shen Y; Vasko IY; Artemyev A; Malaspina DM; Chu X; Angelopoulos V; Zhang X-J

author count

  • 7

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 2169-9380

Electronic International Standard Serial Number (EISSN)

  • 2169-9402

Additional Document Info

volume

  • 126

issue

  • 9

number

  • ARTN e2021JA029380