Quantifying point defects in Cu2ZnSn(S,Se)(4) thin films using resonant x-ray diffraction Journal Article uri icon

Overview

publication date

  • October 17, 2016

has restriction

  • hybrid

Date in CU Experts

  • December 4, 2021 1:04 AM

Full Author List

  • Stone KH; Christensen ST; Harvey SP; Teeter G; Repins IL; Toney MF

author count

  • 6

citation count

  • 13

Other Profiles

International Standard Serial Number (ISSN)

  • 0003-6951

Electronic International Standard Serial Number (EISSN)

  • 1077-3118

Additional Document Info

volume

  • 109

issue

  • 16

number

  • ARTN 161901