Development of a soft X-ray ptychography beamline at SSRL and its application in the study of energy storage materials Conference Proceeding uri icon


publication date

  • August 12, 2015

has restriction

  • closed

Date in CU Experts

  • December 4, 2021 1:04 AM

Full Author List

  • Wise AM; Ohldag H; Chueh W; Turner J; Toney MF; Weker JN

Full Editor List

  • Lai B

author count

  • 6

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

Additional Document Info


  • 9592