Trade-Off between Trap Filling, Trap Creation, and Charge Recombination Results in Performance Increase at Ultralow Doping Levels in Bulk Heterojunction Solar Cells Journal Article uri icon

Overview

publication date

  • December 21, 2016

has restriction

  • closed

Date in CU Experts

  • December 27, 2021 3:03 AM

Full Author List

  • Shang Z; Heumueller T; Prasanna R; Burkhard GF; Naab BD; Bao Z; McGehee MD; Salleo A

author count

  • 8

citation count

  • 46

Other Profiles

International Standard Serial Number (ISSN)

  • 1614-6832

Electronic International Standard Serial Number (EISSN)

  • 1614-6840

Additional Document Info

volume

  • 6

issue

  • 24

number

  • ARTN 1601149