Frequency instability and phase noise characterization of an integrated chip-scale optomechanical oscillator Conference Proceeding uri icon


publication date

  • May 10, 2015

Date in CU Experts

  • June 17, 2023 8:12 AM

Full Author List

  • Huang Y; Wu J; Luan X; Huang S-W; Yu M; Lo G; Kwong D-L; Wen G; Wong CW

author count

  • 9

Other Profiles

International Standard Serial Number (ISSN)

  • 2160-9020