Electron impact ionization: A new parameterization for 100 eV to 1 MeV electrons Journal Article uri icon

Overview

publication date

  • September 11, 2008

Date in CU Experts

  • September 9, 2013 9:27 AM

Full Author List

  • Fang X; Randall CE; Lummerzheim D; Solomon SC; Mills MJ; Marsh DR; Jackman CH; Wang W; Lu G

author count

  • 9

citation count

  • 54

Other Profiles

International Standard Serial Number (ISSN)

  • 2169-9380

Electronic International Standard Serial Number (EISSN)

  • 2169-9402

Additional Document Info

volume

  • 113

issue

  • A9

number

  • ARTN A09311