Field Test Validation of Single-Element Antenna with Anti-Jam and Spoof Detection
Conference Proceeding
Overview
publication date
- September 14, 2015
Date in CU Experts
- January 30, 2024 3:38 AM
Full Author List
- McMilin E; Chen Y-H; De Lorenzo DS; Lo S; Akos D; Enge P
author count
- 6
citation count
- 5
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 2331-5911
Electronic International Standard Serial Number (EISSN)
- 2331-5954
Additional Document Info
start page
- 3314
end page
- 3324