Investigation of the resist outgassing and hydrocarbonaceous contamination induced in multi electron beams lithography tools Conference Proceeding
Overview
publication date
- February 24, 2014
has restriction
- closed
Date in CU Experts
- May 22, 2024 8:44 AM
Full Author List
- Mebiene-Engohang A-P; Pourteau ML; Marusic JC; Pain L; Nakayama T; Miyake A; Smits M; David S; Labau S; Boussey J
Full Editor List
- Resnick DJ; Bencher C
author count
- 10
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 9049