“In-Situ Multilayer Printed Circuit Board Characterization Using One-Port Measurements In-Situ Multilayer Printed Circuit Board Characterization Using One-Port Measurements" Conference Proceeding uri icon

Overview

publication date

  • January 27, 2024

Date in CU Experts

  • February 1, 2025 9:23 AM

Full Author List

  • Rao A; Bogatin E; Piket-May M

author count

  • 3