A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire Journal Article uri icon


publication date

  • February 1, 1997

Full Author List

  • Dehm G; Ruhle M; Conway HD; Raj R

Other Profiles

Additional Document Info

start page

  • 489

end page

  • 499


  • 45


  • 2