A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire Journal Article uri icon

Overview

publication date

  • February 1, 1997

Date in CU Experts

  • January 13, 2014 8:01 AM

Full Author List

  • Dehm G; Ruhle M; Conway HD; Raj R

author count

  • 4

citation count

  • 22

Other Profiles

International Standard Serial Number (ISSN)

  • 1359-6454

Additional Document Info

start page

  • 489

end page

  • 499

volume

  • 45

issue

  • 2