Morphology of multilayer Ag/Ag(100) films versus deposition temperature: STM analysis and atomistic lattice-gas modeling Journal Article uri icon

Overview

publication date

  • January 1, 2001

Date in CU Experts

  • January 15, 2014 10:46 AM

Full Author List

  • Caspersen KJ; Stoldt CR; Layson AR; Bartelt MC; Thiel PA; Evans JW

author count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0163-1829

Electronic International Standard Serial Number (EISSN)

  • 1095-3795

Additional Document Info

volume

  • 63

issue

  • 8

number

  • 085401