High-resolution LEED profile analysis and diffusion barrier estimation for submonolayer homoepitaxy of Ag/Ag(100) Journal Article uri icon

Overview

publication date

  • May 1, 1998

Date in CU Experts

  • January 15, 2014 10:52 AM

Full Author List

  • Bardotti L; Stoldt CR; Jenks CJ; Bartelt MC; Evans JW; Thiel PA

author count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0163-1829

Electronic International Standard Serial Number (EISSN)

  • 1095-3795

Additional Document Info

start page

  • 12544

end page

  • 12549

volume

  • 57

issue

  • 19