A Study of Variance Reduction Techniques for Estimating Circuit Yields Journal Article uri icon

Overview

publication date

  • July 1, 1983

Date in CU Experts

  • April 8, 2014 12:04 PM

Full Author List

  • Hocevar DE; Lightner MR; Trick TN

author count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0278-0070

Additional Document Info

start page

  • 180

end page

  • 192

volume

  • 2

issue

  • 3