Study of micro-scale limits of solder self-assembly for MEMS Conference Proceeding

Overview

CU Boulder Authors

• Bright, Victor Mark
• Lee, Y. C.

publication date

• May 21, 2000

has restriction

• closed

Date in CU Experts

• May 28, 2014 4:03 AM

Full Author List

• Harsh KF; Bright VM; Lee YC

author count

• 3

citation count

• 18

published in

• Electronic Components and Technology Conference  Journal

presented at event

• 50th Electronic Components & Technology Conference (ECTC 01)  Conference

Other Profiles

International Standard Serial Number (ISSN)

• 0569-5503

Electronic International Standard Serial Number (EISSN)

• 2377-5726

Digital Object Identifier (DOI)

• 10.1109/ECTC.2000.853447

International Standard Book Number (ISBN) 10

• 0-7803-5908-9

Additional Document Info

start page

• 1690

end page

• 1695