Microstructural evolution induced by micro-cracking during fast lithiation of single-crystalline silicon Journal Article
Overview
publication date
- November 1, 2014
has restriction
- green
Date in CU Experts
- July 25, 2014 3:49 AM
Full Author List
- Choi YS; Pharr M; Kang CS; Son S-B; Kim SC; Kim K-B; Roh H; Lee S-H; Oh KH; Vlassak JJ
author count
- 10
citation count
- 38
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0378-7753
Electronic International Standard Serial Number (EISSN)
- 1873-2755
Digital Object Identifier (DOI)
Additional Document Info
start page
- 160
end page
- 165
volume
- 265