Microstructural evolution induced by micro-cracking during fast lithiation of single-crystalline silicon Journal Article uri icon

Overview

publication date

  • November 1, 2014

has restriction

  • green

Date in CU Experts

  • July 25, 2014 3:49 AM

Full Author List

  • Choi YS; Pharr M; Kang CS; Son S-B; Kim SC; Kim K-B; Roh H; Lee S-H; Oh KH; Vlassak JJ

author count

  • 10

citation count

  • 31

Other Profiles

International Standard Serial Number (ISSN)

  • 0378-7753

Electronic International Standard Serial Number (EISSN)

  • 1873-2755

Additional Document Info

start page

  • 160

end page

  • 165

volume

  • 265