Competition between Al2O3 atomic layer etching and AlF3 atomic layer deposition using sequential exposures of trimethylaluminum and hydrogen fluoride Journal Article
Overview
publication date
- February 7, 2017
has restriction
- closed
Date in CU Experts
- February 11, 2017 3:28 AM
Full Author List
- DuMont JW; George SM
author count
- 2
citation count
- 33
published in
- Journal of Chemical Physics Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0021-9606
Electronic International Standard Serial Number (EISSN)
- 1089-7690
Digital Object Identifier (DOI)
Additional Document Info
volume
- 146
issue
- 5
number
- ARTN 052819