New methodologies for measuring film thickness, coverage, and topography Conference Proceeding uri icon

Overview

publication date

  • August 9, 1999

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:40 AM

Full Author List

  • Mate CM; Yen BK; Miller DC; Toney MF; Scarpulla M; Frommer JE

author count

  • 6

citation count

  • 44

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9464

Additional Document Info

start page

  • 110

end page

  • 114

volume

  • 36

issue

  • 1