Dominant role of grain boundary scattering in the resistivity of nanometric Cu films Journal Article uri icon

Overview

publication date

  • January 1, 2009

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:40 AM

Full Author List

  • Sun T; Yao B; Warren AP; Barmak K; Toney MF; Peale RE; Coffey KR

author count

  • 7

citation count

  • 92

Other Profiles

International Standard Serial Number (ISSN)

  • 1098-0121

Additional Document Info

volume

  • 79

issue

  • 4

number

  • ARTN 041402