Dominant role of grain boundary scattering in the resistivity of nanometric Cu films Journal Article uri icon

Overview

publication date

  • January 1, 2009

Full Author List

  • Sun T; Yao B; Warren AP; Barmak K; Toney MF; Peale RE; Coffey KR

Other Profiles

Additional Document Info

volume

  • 79

issue

  • 4