Quantitative analysis of lattice disorder and crystallite size in organic semiconductor thin films Journal Article uri icon

Overview

publication date

  • July 7, 2011

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:40 AM

Full Author List

  • Rivnay J; Noriega R; Kline RJ; Salleo A; Toney MF

author count

  • 5

citation count

  • 222

Other Profiles

International Standard Serial Number (ISSN)

  • 2469-9950

Electronic International Standard Serial Number (EISSN)

  • 2469-9969

Additional Document Info

volume

  • 84

issue

  • 4

number

  • ARTN 045203