X-ray scattering study of thin films of poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene)
Journal Article
Overview
publication date
- March 21, 2007
has subject area
- Biomedical and Dental Materials - Polymers
- Chemical Phenomena - X-Ray Diffraction
- Chemistry Techniques, Analytical - X-Ray Diffraction
- Chemistry Techniques, Analytical - X-Ray Diffraction
- Heterocyclic Compounds, 1-Ring - Thiophenes
- Macromolecular Substances - Polymers
- Manufactured Materials - Polymers
- Minerals - Silicon Dioxide
- Organic Chemicals - Thiophenes
- Organosilicon Compounds - Silanes
- Oxygen Compounds - Silicon Dioxide
- Physical Phenomena - X-Ray Diffraction
- Semiconductors
- Silicon Compounds - Silanes
- Silicon Compounds - Silicon Dioxide
has restriction
- closed
Date in CU Experts
- November 5, 2020 2:40 AM
Full Author List
- Chabinyc ML; Toney MF; Kline RJ; McCulloch I; Heeney M
author count
- 5
citation count
- 313
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0002-7863
Electronic International Standard Serial Number (EISSN)
- 1520-5126
Digital Object Identifier (DOI)
Additional Document Info
start page
- 3226
end page
- 3237
volume
- 129
issue
- 11