Clustering and variance maps for cryo-electron tomography using wedge-masked differences Journal Article uri icon

Overview

publication date

  • September 1, 2011

Date in CU Experts

  • September 6, 2013 4:04 AM

Full Author List

  • Heumann JM; Hoenger A; Mastronarde DN

author count

  • 3

citation count

  • 104

Other Profiles

International Standard Serial Number (ISSN)

  • 1047-8477

Additional Document Info

start page

  • 288

end page

  • 299

volume

  • 175

issue

  • 3