In situ examination of tin oxide atomic layer deposition using quartz crystal microbalance and Fourier transform infrared techniques Journal Article uri icon

Overview

publication date

  • July 1, 2005

has restriction

  • closed

Date in CU Experts

  • September 6, 2013 4:39 AM

Full Author List

  • Du X; Du Y; George SM

author count

  • 3

citation count

  • 54

Other Profiles

International Standard Serial Number (ISSN)

  • 0734-2101

Electronic International Standard Serial Number (EISSN)

  • 1520-8559

Additional Document Info

start page

  • 581

end page

  • 588

volume

  • 23

issue

  • 4