Defect-Driven Interfacial Electronic Structures at an Organic/Metal-Oxide Semiconductor Heterojunction Journal Article uri icon

Overview

publication date

  • July 16, 2014

has restriction

  • closed

Date in CU Experts

  • March 29, 2023 11:42 AM

Full Author List

  • Winget P; Schirra LK; Cornil D; Li H; Coropceanu V; Ndione PF; Sigdel AK; Ginley DS; Berry JJ; Shim J

author count

  • 14

citation count

  • 45

Other Profiles

International Standard Serial Number (ISSN)

  • 0935-9648

Electronic International Standard Serial Number (EISSN)

  • 1521-4095

Additional Document Info

start page

  • 4711

end page

  • +

volume

  • 26

issue

  • 27