Flash-induced defects in single-crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy Journal Article uri icon

Overview

publication date

  • September 1, 2024

has restriction

  • closed

Date in CU Experts

  • May 29, 2024 12:06 PM

Full Author List

  • Jo S; Kindelmann M; Jennings D; Balice L; Sohn YJ; Scheld WS; Bram M; Guillon O; Mayer J; Raj R

author count

  • 10

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0002-7820

Electronic International Standard Serial Number (EISSN)

  • 1551-2916

Additional Document Info

start page

  • 5786

end page

  • 5800

volume

  • 107

issue

  • 9