Robust low-overlap 3-D point cloud registration for outlier rejection Conference Proceeding uri icon

Overview

publication date

  • May 20, 2019

Date in CU Experts

  • December 17, 2019 9:46 AM

Full Author List

  • Stechschulte J; Ahmed N; Heckman C

Full Editor List

  • Howard A; Althoefer K; Arai F; Arrichiello F; Caputo B; Castellanos J; Hauser K; Isler V; Kim J; Liu H

author count

  • 3

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 1050-4729

Electronic International Standard Serial Number (EISSN)

  • 2577-087X

Additional Document Info

start page

  • 7143

end page

  • 7149