Three-dimensional textures and defects of soft material layering revealed by thermal sublimation
Journal Article
Overview
publication date
has subject area
-
Chemical Phenomena - X-Ray Diffraction
-
Chemistry Techniques, Analytical - X-Ray Diffraction
-
Chemistry Techniques, Analytical - X-Ray Diffraction
-
Diagnostic Imaging - Imaging, Three-Dimensional
-
Diagnostic Imaging - Microscopy, Atomic Force
-
Diagnostic Imaging - Microscopy, Electron
-
Diagnostic Imaging - Microscopy, Fluorescence
-
Image Processing, Computer-Assisted - Imaging, Three-Dimensional
-
Investigative Techniques - Microscopy, Atomic Force
-
Investigative Techniques - Microscopy, Electron
-
Investigative Techniques - Microscopy, Fluorescence
-
Liquid Crystals
-
Materials Testing
-
Nanostructures
-
Physical Phenomena - X-Ray Diffraction
-
Surface Properties
-
Thermogravimetry
has restriction
Date in CU Experts
Full Author List
-
Yoon DK; Kim YH; Kim DS; Oh SD; Smalyukh II; Clark NA; Jung H-T
author count
citation count
published in
Other Profiles
International Standard Serial Number (ISSN)
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue