Thin film structure of tetraceno[2,3-b]thiophene characterized by grazing incidence X-ray scattering and near-edge X-ray absorption fine structure analysis Journal Article uri icon

Overview

publication date

  • March 19, 2008

has subject area

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:40 AM

Full Author List

  • Yuan Q; Mannsfeld SCB; Tang ML; Toney MF; Luening J; Bao Z

author count

  • 6

citation count

  • 61

Other Profiles

International Standard Serial Number (ISSN)

  • 0002-7863

Electronic International Standard Serial Number (EISSN)

  • 1520-5126

Additional Document Info

start page

  • 3502

end page

  • 3508

volume

  • 130

issue

  • 11